On Generalized Start-up Demonstration Tests
In this paper, a more general start-up demonstration test is introduced. CSTF, TSTF, TSCF and CSCF are all special situations of the new tests. For the new generalized start-up demonstration test, under the assumption of independent and identically distributed for each test, the analytic xpressions for the expectation, the probability mass function and the distribution of the test length, as well as the probability of acceptance or rejection of the unit are given. All the analyses are based on the finite Markov chain imbedding approach which makes the results readily understood and easily extended to the non-i.i.d. cases. A numerical example is presented to make our results more transparent and demonstrate the advantages of the new test.
Start-up reliability demonstration test finite Markov chain imbedding approach
XIAN ZHAO WEIJUAN XIE AIMIN HE
School of Management & Economics, Beijing Institute of Technology, Beijing, P. R. China, 100081
国际会议
北京
英文
93-98
2011-06-20（万方平台首次上网日期，不代表论文的发表时间）