Failure Process Modeling for Systems with General Repairs

摘要：

Many methods on modeling failure processes of repairable systems have been developed. Based on different assumptions on the repairs, the models can be classified into three categories: models for minimal repair, models for general repair and models for perfect repair. In this paper, we will discuss a log linear model based on the general repair assumption. This model is integrated with the Kijima virtual age model to consider the repair effect on failure intensity.

关键词： Log-linear model Kijima Model Virtual age

作者: HUAIRUI GUO HAITAO LIAO JULIO PULIDO

作者单位: ReliaSoft Corporation,Tucson, Arizona, 85710, USA University of Tennessee, Knoxville, Tennessee, 37996, USA Ingersoll Rand,Minneapolis, Minnesota, 55044, USA

会议类型: 国际会议

会议名称: The 7th Inyernational Conference on Mathematical Methods in Reliability:Theory,Methods,Applications(第七届国际可靠性数学、理论、方法与应用会议 MMR2011)

会议地点: 北京

会议语种:英文

页码: 170-175

在线出版日期: 2011-06-20（万方平台首次上网日期，不代表论文的发表时间）