Models Comparison for Step-stress Accelerated Life Testing

摘要：

In this paper, we compare four commonly used models for a step-stress accelerated life test. It is found that the CE model, the LCE model and the TRV model are identical when the underlying distribution belongs to a log-location-scale family, which is usually use in describing the lifetime of a product, with the log-location parameter varying on the changing stress and the log-scale parameter keeping constant. A likelihood criterion is recommended to test the TFR model and the CE model under the Weibull distribution.

关键词： CE model LCE model TRV model TFR model

作者: XU HAIYAN

作者单位: Department of Mathematics, Shanghai Normal University, Scientific Computing Key Laboratory of Shanghai Universities, Division of Computational Science, E-Institute of Shanghai Universities, 100 Guilin Road, Shanghai 200234, P. R. China

会议类型: 国际会议

会议名称: The 7th Inyernational Conference on Mathematical Methods in Reliability:Theory,Methods,Applications(第七届国际可靠性数学、理论、方法与应用会议 MMR2011)

会议地点: 北京

会议语种:英文

页码: 409-413

在线出版日期: 2011-06-20（万方平台首次上网日期，不代表论文的发表时间）