On the Sensitivity of ALT Optimal Test Plan to Weibull Shape Parameter
Accelerated life tests (ALT) are commonly used to obtain reliability prediction of new products. These tests are often censored due to the consideration of time and cost. In order to find the local optimal test plan under data right censoring, a generalized linear model (GLM) method, based on the proportional hazard (PH) model, is introduced in this paper. We discuss the D-optimal and (7c-optimal test plans and their sensitivities to the assumptions on failure time distribution parameters.
ALT GLM PH model optimal test plans censoring
TAO YANG RONG PAN
School of Computing, Informatics, and Decision Systems Engineering Arizona State University, Tempe, Arizona 85287-8809
国际会议
北京
英文
835-844
2011-06-20(万方平台首次上网日期,不代表论文的发表时间)