会议专题

Optimum Design for Type-I Step-Stress Accelerated Life Tests of Two-parameter Weibull Distributions

In the paper, we focus on k-step step-stress accelerated life tests with censored sample from twoparameter Weibull distributions based on the tampered failure rate (TFR) model. We get the optimum design for the TFR model using the likelihood function and Fisher information matrix. Finally, we illustrate the feasibility of this method through two examples.

Weibull distribution Type-I censoring k-step step-stress accelerated life test TFR model maximum likelihood estimation

PEIRONG XU YINCAI TANG HAIYAN XU

School of Finance and Statistics, East China Normal University, Shanghai, 200241, P.R. China College of Mathematical Sciences, Shanghai Normal University, Shanghai, 200234, P.R. China

国际会议

The 7th Inyernational Conference on Mathematical Methods in Reliability:Theory,Methods,Applications(第七届国际可靠性数学、理论、方法与应用会议 MMR2011)

北京

英文

872-881

2011-06-20(万方平台首次上网日期,不代表论文的发表时间)