Optimum Design for Type-I Step-Stress Accelerated Life Tests of Two-parameter Weibull Distributions
In the paper, we focus on k-step step-stress accelerated life tests with censored sample from twoparameter Weibull distributions based on the tampered failure rate (TFR) model. We get the optimum design for the TFR model using the likelihood function and Fisher information matrix. Finally, we illustrate the feasibility of this method through two examples.
Weibull distribution Type-I censoring k-step step-stress accelerated life test TFR model maximum likelihood estimation
PEIRONG XU YINCAI TANG HAIYAN XU
School of Finance and Statistics, East China Normal University, Shanghai, 200241, P.R. China College of Mathematical Sciences, Shanghai Normal University, Shanghai, 200234, P.R. China
国际会议
北京
英文
872-881
2011-06-20(万方平台首次上网日期,不代表论文的发表时间)