Reliability Evaluation of An Implantable Deep Brain Stimulator

摘要：

The long-term reliability of an implantable deep brain stimulator is very important. In this paper, the long-term reliability of an implantable deep brain stimulator was evaluated through a series of stress and accelerated life tests on the devices and PCB of the stimulator. The PCB circuit was subjected to temperature shock, vibration test, temperature cycling, burn-in, and accelerated life test The devices were subjected to temperature shock, temperature cycling and burn-ins. All the samples of deep brain stimulators passed the whole tests. Results of this study confirmed the reliability of the deep brain stimulator has been used in the clinical trial.

关键词： implantable medical device long-term reliability burn-in clinical trial

作者: Weiming Wang Bozhi Ma Hongwei Hao Luming Li

作者单位: School of Aerospace, Tsinghua University Beijing, China

会议类型: 国际会议

会议名称: 2011 9th International Conference on Reliability,Maintainability and Safety(第九届国际可靠性、维修性、安全性会议 ICRMS2011)

会议地点: 贵阳

会议语种:英文

页码: 5-8

在线出版日期: 2011-06-12（万方平台首次上网日期，不代表论文的发表时间）