Research on Reliability Assessment of Metalized Film Capacitors Based on T Performance Degradation Test
Metalized film capacitor is a kind of product with a long lifetime and high reliability, so it is difficult to assess its lifetime and reliability using the traditional statistical inference based on the large sample of data from the lifetime test Therefore, first, this paper presents a type of test called T performance degradation test, which is divided into several stages. During the test, the number of capacitors which are still under working conditions decreases stage by stage until the test lasts a long time with very fewer capacitors. Finally, this paper presents a reliability assessment method based on the data from the test At last, an application on the reliability assessment of the energy system of the laser facility is presented.
metallized film capacitor reliability modeling degradation path Tperformance degradation test
Yanzhen Tang Quan Sun Jing Feng
College of Information System and Management National University of Defense Technology Changsha, China
国际会议
贵阳
英文
18-22
2011-06-12（万方平台首次上网日期，不代表论文的发表时间）