Degradation Data-based Quantitative Qualification for High Reliable Microelectronic Device
The quality (or reliability) cannot be qualified for high reliable microelectronic devices (failure rate less than 10-6/h) through qualification and quality conformance procedures in military standard. A method of quantitative qualification is proposed based on the distribution of degraded tests parameters for Destructive Physical Analysis (DPA). Firstly, based on the 5005.2 method (qualification and quality conformance procedures) in GJB 548B, a new inspection program is proposed for high reliable microelectronic devices. Then, the basic theory, general process, and mathematical model for quantitative qualification are presented. Finally, a quantitative value of failure rate or reliability for microelectronic devices can be drawn according to the new inspection program and qualification method. The case study conducted on programmable timer samples shows that the failure rate or reliability of high reliable microelectronics can be qualified quantitatively.
quantitative qualification degradation data high reliability microelectronic device
Bo Sun Jiuzheng Cui Qiang Feng
School of Reliability and Systems Engineering, BEIHANG University Beijing China
国际会议
贵阳
英文
159-164
2011-06-12（万方平台首次上网日期，不代表论文的发表时间）