Research on Method about Reliability Predictic and Evaluation of Computer Measurement and Control System

摘要：

Institute of Applied Electronics, CAEP P.O. Box 9191011, Sichuan Mianyang 621900, China Abstract—Reliability prediction methods for a computer measure and control system with apparatus counting method and similar product method are presented. MTBF is predicted to find weak parts in system design. The prediction will provide basis for reliability allocation.

关键词： apparatus counting method simitar product method elementary reliability

作者: Hongyan Zhou Yingsong Song Jiaru Zhang

作者单位: Institute of Applied Electronics, CAEP P.O.Box 919-1011, Sichuan Mianyang 621900, China

会议类型: 国际会议

会议名称: 2011 9th International Conference on Reliability,Maintainability and Safety(第九届国际可靠性、维修性、安全性会议 ICRMS2011)

会议地点: 贵阳

会议语种:英文

页码: 175-178

在线出版日期: 2011-06-12（万方平台首次上网日期，不代表论文的发表时间）