Analysis of the Degradation of the Static Characteristics of Aged Discrete and Monolitic Components

摘要：

This paper characterizes and analyzes a sample of aged components and compares the results with their original specifications. Analysis of the data is expected to provide a better understanding of the aging process and possible failure mechanisms of electronic components. In this paper we analyze TTL integrated circuits and CMOS integrated circuits, resistors, capacitors, transistors and diodes.

关键词： liability Accelerated life testing Electronic components aging

作者: Jorge Marcos-Acevedo Enrique Soto-Campos Santiago Fernandez-Gomez

作者单位: Dpto.De Tecnologia Electr6nica Universidad de Vigo Vigo, Spain Sunnyvale, CA, USA

会议类型: 国际会议

会议名称: 2011 9th International Conference on Reliability,Maintainability and Safety(第九届国际可靠性、维修性、安全性会议 ICRMS2011)

会议地点: 贵阳

会议语种:英文

页码: 235-241

在线出版日期: 2011-06-12（万方平台首次上网日期，不代表论文的发表时间）