Accelerated Degradation Data Statistical Model Based on First Passage Time
This paper discusses accelerated degradation failure problem of the electronic products, and puts forward the accelerated degradation data statistical model based on first passage time. Then the model with the computer simulation is verified.
First passage time accelerated degradation data Computer simulation Arrhenius model
Hecai Liu Ling Yang
Department of Mathematics Guiyang University Guiyang, China Reliability Engineering Research Center Guizhou University Guiyang, China
国际会议
贵阳
英文
369-371
2011-06-12(万方平台首次上网日期,不代表论文的发表时间)