会议专题

Accelerated Degradation Data Statistical Model Based on First Passage Time

This paper discusses accelerated degradation failure problem of the electronic products, and puts forward the accelerated degradation data statistical model based on first passage time. Then the model with the computer simulation is verified.

First passage time accelerated degradation data Computer simulation Arrhenius model

Hecai Liu Ling Yang

Department of Mathematics Guiyang University Guiyang, China Reliability Engineering Research Center Guizhou University Guiyang, China

国际会议

2011 9th International Conference on Reliability,Maintainability and Safety(第九届国际可靠性、维修性、安全性会议 ICRMS2011)

贵阳

英文

369-371

2011-06-12(万方平台首次上网日期,不代表论文的发表时间)