A New Method of Deciding the Sample Number of Reliability Growth Tests for Success-failure Products

摘要：

New method of deciding the sample number of reliability growth tests for success-failure products was researched. The mathematical model was established with maximal success number of left products after tests as object function. The initially minimized maximum rule with sample estimation feedback to fix sample numbers of reliability growth tests was deduced. At last, an example was shown to illustrate this method. With comparing the results of adopting different parameters, it is indicated that the rule is robust and practical.

关键词： systemic defaults success-failure products reliability growth test circular correction with sample estimate feedback initially-minimized maximum rule

作者: Xingbo Wang Bo Li Dexin Li Lin Lin

作者单位: Department of Airborne Vehicle Engineering Naval Aeronautical and Astronautical University Yantai, C Science and Technology Department Military Transportation Institute Tianjin, China Department of Electronic Information Engineering Naval Aeronautical and Astronautical University Yan Quality Control Room Aircraft Service Quandron 92514 Unit of PLA Yantai, China

会议类型: 国际会议

会议名称: 2011 9th International Conference on Reliability,Maintainability and Safety(第九届国际可靠性、维修性、安全性会议 ICRMS2011)

会议地点: 贵阳

会议语种:英文

页码: 1034-1039

在线出版日期: 2011-06-12（万方平台首次上网日期，不代表论文的发表时间）