Research and Comparison of Two Life Testing Methods

摘要：

Both traditional life testing method and constant Electrical stress and Temperature Ramp stress Method (CETRM) are described. The two methods are compared taking the GaAs microwave power field effect transistor (FET) DX0011 life testing as an example. CETRM used less testing samples, took shorter testing time, and provided more reliability information than common life testing method.

关键词： Accelerated Life Testing Accelerated Degradation Testing Conventional method of accelerated life testing Constant Electrical stress and Temperature Ramp stress Method

作者: Haochun Qi Changzhi Lu Xiaoling Zhang Xuesong Xie

作者单位: School of Electronic Information and Control Engineering Beijing University of Technology Beijing 100024, China

会议类型: 国际会议

会议名称: 2011 9th International Conference on Reliability,Maintainability and Safety(第九届国际可靠性、维修性、安全性会议 ICRMS2011)

会议地点: 贵阳

会议语种:英文

页码: 1040-1044

在线出版日期: 2011-06-12（万方平台首次上网日期，不代表论文的发表时间）