会议专题

Accelerated Test as a Tool for Reliability Comparison of Systems Manufactured by Different Ways

The paper deals with a highly reliable electronic item containing a flash memory that is programmed during the manufacturing process. Non-intentional causes resulted in non-compliance of programming process with the prescribed manufacturing process. The non-compliance was detected only by accident and that was after some time. However, most of the items manufactured this way have been installed in systems and they have been in operation. A serious problem is the fact that an item potential failure can result in an accident with serious consequences. For this reason it was decided to verify if the errors during manufacturing process have an effect on item reliability. It was also decided to check influence of the manufacturing error using an accelerated test The article describes the test methodology, practical realization of the test and evaluation of test results.

Reliability flash memory accelerated test electronic item

Zdenek Vintr David Valis

Faculty of Military Technology University of Defence Brno, Czech Republic

国际会议

2011 9th International Conference on Reliability,Maintainability and Safety(第九届国际可靠性、维修性、安全性会议 ICRMS2011)

贵阳

英文

1151-1155

2011-06-12(万方平台首次上网日期,不代表论文的发表时间)