CCC Chart for Asymmetric Quality Characteristic in High Yield Processes

摘要：

Due to high-quality manufacturing processes progress and developments, the traditional p chart and np chart are not suitable in process monitoring for very low nonconforming fraction, p. Cumulative Count of Conforming (CCC) chart has been shown to be useful in a high-quality manufacturing process for monitoring the nonconforming faction. When the quality characteristic is asymmetric and the one direction shifting is of interested, a one-sided control charts would be more appropriate than a two-sided chart. Thus, we construct a one-sided CCC chart and discuss its performance. The results show that the proposed methods could detect the shift more quickly than twosided CCC chart and will not underestimate the ARL values when the process begins to deteriorate at the beginning.

关键词： CCC chart high yield process average run length asymmetric

作者: Jing-Er Chiu Chih-Hsin Tsai

作者单位: Department of Industrial Engineering and Management,Yunlin University of Science and Technology, Taiwan, China

会议类型: 国际会议

会议名称: The Institute Industrial Engineera Asian Conference 2011(2011年国际工业工程师协会亚洲会议)

会议地点: 上海

会议语种:英文

页码: 522-533

在线出版日期: 2011-06-10（万方平台首次上网日期，不代表论文的发表时间）