Surface Energy and Work of Adhesion of Nitrogen-doped Titanium Oxide Films
Nitrogen-doped titanium oxide (TiO2-xNx) films were prepared by ion-assisted electron-beam evaporation,using rutile powder as source material. The films deposited with nitrogen ion bombardment at various nitrogen fractions (FN2),were investigated by X-ray photoelectron spectra. Well-crystallized anatase TiO2 was deposited first without the nitrogen ion bombardment. With nitrogen ion bombardment under increasing FN2,the TiO2-xNx films were formed. The films are still in anatase phase but possessed substitutional nitrogen atoms and chemisorbed molecular N2. Wettability and surface energy of the TiO2-xNx films were also investigated. The TiO2-XNX films deposited at FN2=0.43 exhibited the lowest contact angle and ihe largest polar component of the surface energy. Nitrogen doped into substitutional sites of TiO2 has proven to be indispensable for improved hemocompatibility,as assessed by work of adhesion calculations and x-ray photoemission spectroscopy. We also suggest that TiO2-xNx film deposited at FN2=0.43 can provide an excellent hemocompatible surface from the estimated work of adhesion between the TiO2-xNx films and human blood.
nitrogen doped titanium oxide ion-assisted electron-beam evaporation surface energy workof
LIN Zeng ZHAO Ji-kui BA DE-chun LIU Chun-ming
School of Mechanical Engineering & Automation,Northeastern University,Shenyang 110004,China School o School of Mechanical Engineering & Automation,Northeastern University,Shenyang 110004,China School of Materials & Metallurgy,Northeastern University,Shenyang 110004,China
国际会议
沈阳
英文
202-206
2011-05-22（万方平台首次上网日期，不代表论文的发表时间）