Adhesion Simulations and Experiments of Thick Diamond Films on the Substrate Temperature Field in the DC PJ CVD System
High quality diamond film wafers with different thickness are prepared by high power DC arc plasma jet CVD (DCPJ CVD) method using a CH4/Ar/H2 gas mixture. The substrate temperature is very important to the stable deposition. The software of FLUENT 6.3 and GAMBIT are used to simulate the distribution of the substrate temperature field,the result indicated that the temperature is non-uniform,and turned down quickly out of the anode nozzle. The results of experiments are similar with the simulation. The diamond film wafers of 060mm diameter,lmm thickness were prepared successfully. Characterization by X-ray diffraction,Raman spectroscopy and SEM analysis are also carried out.
Substrate temperature field Simulation Experiment CVD diamond film
CHEN Rong-fa ZHANG Xian-liang LIU Tao PAN Yi ZHU Rui
Department of Mechanical Engineering,Yangzhou University,Yangzhou,225127,China
国际会议
沈阳
英文
207-211
2011-05-22(万方平台首次上网日期,不代表论文的发表时间)