Intelligent Method of Identifying Degraded State for Electronic Devices Based on Neural Network and Fuzzy Integral
Hot Carrier Degraded(HCD), Electro-Static discharge (ESD) and Time-Dependent Dielectric Breakdown (TDDB) are the main failure modes of electronic devices. Identifying degraded state of electronic devices needs considering the combined effects of various factors. In this paper, On the basis of information such as real-time HCD damage, ESD damage, etc were obtained, with the help of fuzzy integral, which has the unique ability of information fusion, a new intelligent method of identifying degraded state of electronic devices was proposed based on neural network and fuzzy integral. Finally, an experiment based on a certain type of electronic device was introduced in detail, and the effectiveness of the intelligent method proposed in this paper was analyzed and validated by the experiment.
Degraded State Neural Network Fuzzy Integral Electronic Devices
Lv Kehong Zhao Chenxu Liu Guanjun Qiu Jing Yang peng
College of Mechatronics and Automation, National University of Defense Technology Changsha 410073, Hunan, China
国际会议
深圳
英文
670-672
2011-03-28（万方平台首次上网日期，不代表论文的发表时间）