The Application of Template Matching Graphic Technology in LED Chip Testing

摘要：

A new LED chip testing system based on template matching graphic technology is developed. A LED chip is located precisely free of touch , with digital graphic disposal technology involving acquisition, orientation, segmentation of graphic, edge detection, outlines distill, and so on. The system proves to be feasible.

关键词： Template matching Edge Testing Orientation Segmentation Outline

作者: Shi Wei Wang Jianguo Dong Zhanmin Zhang Wenxing Cao Liying

作者单位: Inner Mongolia University of Science and Technology, Baotou, Inner Mongolia, 014010, China Tsinghua University, Beijing, 100084, China

会议类型: 国际会议

会议名称: 2011 Fourth International Conference on Intelligent Computation Technology and Automation(2011年第四届智能计算技术与自动化国际会议 ICICTA 2011)

会议地点: 深圳

会议语种:英文

页码: 739-741

在线出版日期: 2011-03-28（万方平台首次上网日期，不代表论文的发表时间）