Test Pattern Generation Technology Based on TPAC and LFSR

摘要：

Linear feedback shift register (LFSR) is widely used in pseudo random test pattern generator, taking advantage of simple structure, little hardware cost, being easy to control and realize. Test patterns applied by circuit under test (TPAC) is a novel self-test technology, which regards the circuit under test as available resource, but uses many multiplexes. This paper drawn on the experience of TPAC and realized a new circuit self test technology based on LFSR. The experiment results on the ISCAS85 benchmark circuits show that the proposed scheme can reduce the extra area effectively.

关键词： IC Testing Test Patterns Generation Fault Efficiency Self-Feedback Test LFSR

作者: M.-M. Guo J.-SH. Kuang

作者单位: School of Information Science and Engineering,Hunan University,Changsha,China School of Information Science and Engineering, Hunan University, Changsha ,China

会议类型: 国际会议

会议名称: 2010 International Conference on Circuit and Signal Processing(2010年电路与信号处理国际会议 ICCSP 2010)

会议地点: 上海

会议语种:英文

页码: 653-656

在线出版日期: 2010-12-25（万方平台首次上网日期，不代表论文的发表时间）