One and Two Arm Reflectometers

摘要：

Bridges have traditionally been used to examine small changes in measured quantities. This is particularly important when limited resolution on large scale instruments, or large quantities to be measured, do not allow examining small changes. Reflectometers may be regarded as bridges, from one point of view. Both one and two arm reflectometers provide high resolution of discontinuities or damage on a cable, even through high levels of attenuation, an area where standard reflectometers would not serve.

关键词： Reflectometers Transmission Line Discontinueties Microwaves Bayesian methods Radar

作者: Jundong Chen Zeju Wu

作者单位: Department of Computer Louisiana Tech University Ruson, USA Department of Communication and electronic Qingdao Technological University Qingdao, China

会议类型: 国际会议

会议名称: 2010 4th International Conference on Intelligent Information Techonlogy Application(第四届智能信息技术应用国际学术研讨会 IITA 2010)

会议地点: 秦皇岛

会议语种:英文

页码: 377-382

在线出版日期: 2010-11-05（万方平台首次上网日期，不代表论文的发表时间）