On the speckle pattern interferometry analysis of instrument errors
Photoelectron interference speckle class precision equipment by many factors, often below standard detection accuracy This paper will mainly measurement error are discussed. Summarizes the error detection system consists of two parts, namely, system error and random error. In this paper the causes that produce these errors were analyzed, Clearly the accuracy of the detection system and a number of parameters. More accurately calculate the size of the various error, clear all errors on the measurement of the degree Proposed to reduce and eliminate these errors specific measures. This type of equipment to improve manufacturing precision, and the proper use of such equipment with some guidance.
Interference device error research
Huang yanping Wang tongyu Sheng Jingqi Yan dongmei Xu Hongji Li wenpeng
Department of Mechanical College Changchun University of Science and Technology 1 Changchun City, Ji Department of Mechanical College Changchun University of Science and Technology 1 Changchun City, Ji Shanghai Technical Institute of Electronic Information Jilin University LibraryChangchun City, Jilin Province, China Jilin City Water Supply Company.Changchun City, Jilin Province, China
国际会议
长春
英文
152-155
2010-08-24（万方平台首次上网日期，不代表论文的发表时间）