会议专题

Analog Circuit Module Level Fault Diagnosis

An approach of feature extraction for analog circuit fault diagnosis is proposed based on the single module soft failure model. Making use of the approach, the single module fault feature extracted can not only be used to distinguish single module circuit fault effectively, but also be applied to the various modules electric circuit of single fault and faults of circumstance. The simulation is carried out where the sample electric circuit outputs is processed to get the fault catalog and the results show that the extracted feature can be used to locate the position of multi-modules fault circuit fault accurately.

analog circuit soft failure features fault diagnosis

Lu-feng Yao Jian-Zhong Wang Chun-xian Zhang

College of science, navy engineering university Wuhan, China College of electricity and information engineering, navy engineering university Wuhan, China

国际会议

The 2010 International Conference on Computer Application and System Modeling(2010计算机应用与系统建模国际会议 ICCASM 2010)

太原

英文

582-585

2010-10-22(万方平台首次上网日期,不代表论文的发表时间)