会议专题

An Adaptive Digital Calibration of Multi-Step A/D Converters

A novel digital technique for efficient calibration of static errors in high-speed, high-resolution, multi-step ADCs is proposed. The parameter update within the calibration method is extended to include and correct effects of temperature and process variations. Additionally, to guide the verification process with the information obtained through monitoring process variations, expectation-maximization method is employed. The algorithm is evaluated on a prototype multi-step ADC converter with embedded dedicated sensors fabricated in standard single poly, six metal 0.09-μm CMOS.

calibration sensors process variation

Amir Zjajo Jose Pineda de Gyvez

Delft University of Technology Mekelweg 4, 2628 CD Delft, The Netherlands Eindhoven University of Technology Den Dolech 2, 5612 AZ Eindhoven, The Netherlands

国际会议

2010 IEEE 10th International Conference on Signal Processing(第十届信号处理国际会议 ICSP 2010)

北京

英文

2456-2459

2010-08-24(万方平台首次上网日期,不代表论文的发表时间)