会议专题

Implement TPS with ATML and NI TestStand

The Automatic Test Markup Language (ATML) is a documentation standard for automatic test information. ATML was born out of the thought that it is the information and a way to communicate that information may be the way to improve upon the inefficiencies of testing in both time and budget ATML defines a collection of IEEE Standards and XML schema that represent automatic test related information (such as test description, test results, LXT description and instrument description) which will provide increased ATE system compatibility and Test Program Set (TPS) transportability. The two most adopted XML schemas in the ATML standard are Test Description (ID) and Test Results. Many organizations are expecting the adoption of ATML TD standards to reduce the development and maintenance costs of TPS and expecting the adoption of Test Results to facilitate sharing the test outcomes up and down the maintenance chain of product This paper discusses how to translate ATML TD to National Instruments (NI) TestStand TPS with ATML TD TestStand translator. Finally, a test report which conformance to ATML standards is generated.

A TML NI TestStand Test Descriptwn ATS

Fan Shuyi Meng chen Jiang huixia

Ordnance Engineering College Shijiazhuang, Hebei,China Ordnance Engineering College Shijiazhuang,Hebei,China

国际会议

2010 3rd IEEE International Conference on Computer Science and Information Technology(第三届IEEE计算机科学与信息技术国际会议 ICCSIT 2010)

成都

英文

538-541

2010-07-07(万方平台首次上网日期,不代表论文的发表时间)