A New Intelligent Fabric Defect Detection And Classification system Based on Gabor Filter and Modified Elman Neural Network

摘要：

In this paper, one fabric defect detection and classification system based on 2D Gabor wavelet transform and Elman neural network is introduced. In the proposed scheme, the texture features of the textile fabric are extracted by using an optimal 2D Gabor filter. A new modified Elman network is proposed to classify the type of fabric defects which have a proportional (P), integral (I) and derivative (D) properties. The proposed inspecting system in this study is more feasible and applicable in fabric defect detection and classification.

关键词： fabric defect detection classification Gabor filter PID Elman neural networ.

作者: Y.H.Zhang C.W.M.Yuen W.K.Wong

作者单位: Institute of Textile and Clothing, The HongKong Polytechnic University, HongKong, China College of I Institute of Textile and Clothing The HongKong Polytechnic University HongKong, China

会议类型: 国际会议

会议名称: The 2nd IEEE International Conference on Advanced Computer Control(第二届先进计算机控制国际会议 ICACC 2010)

会议地点: 沈阳

会议语种:英文

页码: 652-656

在线出版日期: 2010-03-27（万方平台首次上网日期，不代表论文的发表时间）