In-Situ Structure Characterization during Fiber Processing by Synchrotron X-ray Scattering/Diffraction Techniques
The lecture focuses on the current status and fixture trends of the advanced scattering/diffraction techniques to characterize polymer fibers during processing in real time. In particular, the recent simultaneous scattering and diffraction techniques developed at the Advanced Polymers (X27C) Beamline (http://www.bnl.gov/nsls/x27cf), National Synchrotron Light Source (NSLS), Brookhaven National Laboratory (BNL) will be described. This facility is dedicated to simultaneous small-angle X-ray scattering (SAXS) and wide-angle X-ray diffraction (WAXD) experiments 1 over a finite range in reciprocal space. By nature, SAXS probes relatively large-scale structures, in contrast to WAXD that deals mainly with the atomic structure of crystals. SAXS includes not only the diffraction of large lattice spacing, of the order of tens, hundreds or even thousands of inter-atomic distances, but also the scattering by perturbed or non-periodic structures of amorphous and semi-crystalline materials.
Benjamin Chu Benjamin S.Hsiao
Chemistry Department, Stony Brook University, Stony Brook, NY 11794-3400, USA
国际会议
上海
英文
470-472
2009-05-27（万方平台首次上网日期，不代表论文的发表时间）