Discussion and Research of Electronic Testing System for Raw Silk
In order to speed up the research process of domestic electronic testing for raw silk. The general design of the electronic testing system for raw silk was discussed. The hardware structure and software algorithm were described in detail. The SD-l(a kind of raw silk instrument) sensor was improved to make the information of the raw silk size and defects into the computer accurately by DAQ in hardware. As for software, a special program was designed based on virtual instrument. Serials of information data (voltage values)of the raw silk size and defects were got by the measurement of several groups of raw silk with this system. The testing results of the raw silk size and defects were acquired by the analysis of the fluctuating information data of the raw silk size.
Electronic testing for raw silk virtual instrument DAQ Raw silk size Raw silk defects.
Ning QI Qing-guan CHEN
Jiangsu Key Laboratory of Silk engineering, Soochow University,Ganjiang Road 178, Suzhou city 215021, Jiangsu Province, P.R.China
国际会议
上海
英文
597-600
2009-05-27（万方平台首次上网日期，不代表论文的发表时间）