Analysis of the nanoscale manipulation using near-field optical tweezers combined with AFM probe

摘要：

In recent years, optical manipulators based on forces exerted by enhanced evanescent field close to near-field optical probes have provided the access to nonintrusive manipulation of nanometric particles. However, the manipulation capability is restricted to the intensity enhancement of the probe tip due to low emitting efficiency. Here a near-field optical trapping scheme using the combination of an optical fiber probe and an AFM metallic probe is developed theoretically. Calculations are made to analyze the field distributions including tip interaction and the trapping forces in the near-field region by applying a direct calculation of Maxwell stress tensor using three-dimensional FDTD. The results show that the scheme is able to trap particle at the nanoscale with lower laser intensity than that required by conventional near-field optical tweezers.

关键词： Near-field optical tweezers Three-dimensional FDTD Maxwell stress tensor Field enhancement Trapping force

作者: B.H. Liu L.J. Yang J.Tang Y. Wang J.L. Yuan

作者单位: MOE Key Laboratory of Mechanical Manufacture and Automation, Zhejiang University ofTechnology, Hangz School of Mechatronics Engineering, Harbin Institute of Technology, Harbin 150001, China School of Energy and Civil Engineering, Harbin University of Commerce, Harbin 150028, China MOE Key Laboratory of Mechanical Manufacture and Automation, Zhejiang University ofTechnology, Hangz

会议类型: 国际会议

会议名称: The 4th International Conference on High Speed Machining(第四届高速加工国际会议 ICHSM2010)

会议地点: 武汉

会议语种:英文

页码: 184-189

在线出版日期: 2011-05-28（万方平台首次上网日期，不代表论文的发表时间）