Research on ODC based Software Defect Analysis Model

摘要：

In this paper we discuss the fundamental principle of defect analysis, introduce the basic framework of Orthogonal Defect Classification （ ODC ） , and summarize the principle and features of defect analysis based on ODC. Using software defect metric, defect baseline and inference rules to do software process analysis, we propose a novel defect analysis model based on ODC. Combined with practical projects, the principle of this model is discussed in details, and this model can improve the objectivity and effectiveness of defect analysis, which is favorable for the automated defect analysis.

关键词： Software Defects Defect Analysis Orthogonal Defect Classification

作者: Qianran Si Guoying Yan

作者单位: Software Test and Evaluation Center Beijing Institute of Tracking and Telecommunication Technology B Software Test and Evaluation CenterBeijing Institute of Tracking and Telecommunication TechnologyBei

会议类型: 国际会议

会议名称: 2011 International Conference on Information System and Computational Intelligence(2011 IEEE信息系统与计算智能国际会议 ICISCI 2011)

会议地点: 哈尔滨

会议语种:英文

页码: 119-123

在线出版日期: 2011-01-18（万方平台首次上网日期，不代表论文的发表时间）