Optical Properties of CuInSi Nanocomposite Thin Film Deposited by Magnetron Co-sputtering

摘要：

Thin CuInSi nanocomposite films were prepared by magnetron co-sputtering. The structures of CuInSi nanocomposite films were detected by X-ray diffraction(XRD); XRD studies of the annealed films indicate the presence of CuInSi, the main crystal phase peak is at 2θ=42.400°. The transmittance (T) spectra of the films were measured by Shimadzu UV-2450 double beam spectrophotometer. The band gap has been estimated from the optical absorption studies and found to be about 1.40 eV, but changes with purity of CuInSi.

关键词： magnetron co-sputtering CuInSi film nanocomposite optical absorption nanocrystalline

作者: Jiansheng Xie Jinhua Li Ping Luan

作者单位: School of Mathematics and Physics, Changzhou University, Changzhou 213164, Jiangsu, China

会议类型: 国际会议

会议名称: 2010 6th International Conference on MENS NANO,and Smart System(2010年微机电纳米、智能系统国际会议 ICMENS 2010)

会议地点: 长沙

会议语种:英文

页码: 55-57

在线出版日期: 2010-12-14（万方平台首次上网日期，不代表论文的发表时间）