A Method of Device Fault Injection Based on Virtual Machine

摘要：

Input and output device are becoming the larger part of a computer system. Previous studies have shown that device errors seem to be one of the most important sources of systems misbehavior. Their failure can have significant influence on applications on the system and cause serious damages to the system as a whole. In order to tolerate, correct and avoid such problems to gain high reliability and high security, the measure of fault tolerance, error-correction and fault avoidance is needed. A fault injector is a tool to test and verify these measures. In this paper, a new method to inject device faults is introduced, namely, to inject faults to the operate system and the applications on the operate system based on a virtual machine. In this way, no stub is needed to insert in the object system, hence avoid the side effect on the object system. And the expense for fault injector hardware is no longer necessary. Furthermore, it can fit for all different applications in the same operate system. At the end of the paper, we prove our method by a simple fault injector based on Xen.

关键词： Fault Injector Evaluation Testing Virtual Machine Xen

作者: Zhou Yuyu Shang Lihong

作者单位: Compute Science Department Beijing University of Aeronautics and Astronautics Beijing, China Computer Science Department Beijing University of Aeronautics and Astronautics Beijing, China

会议类型: 国际会议

会议名称: 2010 International Conference on Future Information Technology(2010年未来信息技术国际会议 ICFIT 2010)

会议地点: 长沙

会议语种:英文

页码: 360-364

在线出版日期: 2010-12-14（万方平台首次上网日期，不代表论文的发表时间）