Efficient Simulation of Structural Faults for the Reliability Evaluation at System-Level

摘要：

In recent technology nodes, reliability is considered a part of the standard design flow at all levels of embedded system design. While techniques that use only low-level models at gate- and register transferlevel offer high accuracy, they are too inefficient to consider the overall application of the embedded system. Multi-level models with high abstraction are essential to efficiently evaluate the impact of physical defects on the system. This paper provides a methodology that leverages state-of-the-art techniques for efficient fault simulation of structural faults together with transaction-level modeling. This way it is possible to accurately evaluate the impact of the faults on the entire hardware/software system. A case study of a system consisting of hardware and software for image compression and data encryption is presented and the method is compared to a standard gate/RT mixed-level approach.

关键词： Fault simulation multi-level transaction-level modeling

作者: Michael A. Kochte Christian G. Zoellin Rafal Baranowski Nadereh Hatami Stefano Di Carlo Michael E. Imhof Hans-Joachim Wunderlich

作者单位: University of Stuttgart Institute of Computer Architecture and Computer Engineering Pfaffenwaldring University of Stuttgart Institute of Computer Architecture and Computer Engineering Pfaffenwaldring Paolo Prinetto Politecnico di Torino Dipartimento di Automatica e Informatica Corso Duca degli Abruz

会议类型: 国际会议

会议名称: 2010 19th IEEE Asian Test Symposium(第19届IEEE亚洲测试技术学术会议 ATS 2010)

会议地点: 上海

会议语种:英文

页码: 3-8

在线出版日期: 2010-12-01（万方平台首次上网日期，不代表论文的发表时间）