Derivation of Optimal Test Set for Detection of Multiple Missing-Gate Faults in Reversible Circuits

摘要：

Logic synthesis of reversible circuits has received considerable attention in the light of advances recently made in quantum computation. Implementation of a reversible circuit is envisaged by deploying several special types of quantum gates, such as iCNOT. Although the classical stuck-at fault model is widely used for testing conventional CMOS circuits, new fault models, namely single missing-gate fault (SMGF), repeated-gate fault (RGF), partial missinggate fault (PMGF), and multiple missing-gate fault (MMGF). have been found to be more suitable for modeling defects in quantum i-CNOT gates. This article presents an efficient algorithm to derive an optimal test set (OTS) for detection of multiple missing-gate faults in a reversible circuit implemented with t-CNOT gates. It is shown that the OTS is sufficient to detect all single missing-gate faults (SMGFs) and all detectable repeated gate faults (RGFs). Experimental results on some benchmark circuits are also reported.

关键词： Missing-gate faults quantum computing reversible logic testable design universal test set

作者: Dipak K. Kole Hafizur Rahatnan Debesh K Das Bhargab B. Bhattacharya

作者单位: Information Technology Department, Bengal Engineering & Science University, Shibpur, Howrah, India Dept. of Computer Sc. and Engg., Jadavpur University, Jadavpur, India ACM Unit, Indian Statistical Institute, Kolkata, India

会议类型: 国际会议

会议名称: 2010 19th IEEE Asian Test Symposium(第19届IEEE亚洲测试技术学术会议 ATS 2010)

会议地点: 上海

会议语种:英文

页码: 33-38

在线出版日期: 2010-12-01（万方平台首次上网日期，不代表论文的发表时间）