On Determining the Real Output Xs by SAT-Based Reasoning

摘要：

Embedded testing, built-in self-test and methods for test compression rely on efficient test response compaction. Often, a circuit under test contains sources of unknown values (X), uninitialized memories for instance. These X values propagate through the circuit and may spoil the response signatures. The standard way to overcome this problem is X-masking. Outputs which carry an X value are usually determined by logic simulation. In this paper, we show that the amount of Xs is significantly overestimated, and in consequence outputs are overmasked, too. An efficient way for the exact computation of output Xs is presented for the first time. The resulting X-masking promises significant gains with respect to test time, test volume and fault coverage.

关键词： X-Masking

作者: Melanie Elm Michael A. Kochte Hans-Joachim Wunderlich

作者单位: University of Stuttgart Institute of Computer Architecture and Computer Engineering Pfaffenwaldring 47, 70569 Stuttgart, Germany

会议类型: 国际会议

会议名称: 2010 19th IEEE Asian Test Symposium(第19届IEEE亚洲测试技术学术会议 ATS 2010)

会议地点: 上海

会议语种:英文

页码: 39-44

在线出版日期: 2010-12-01（万方平台首次上网日期，不代表论文的发表时间）