Variation-Aware Fault Modeling

摘要：

To achieve a high product quality for nano-scale systems both realistic defect mechanisms and process variations must be taken into account. While existing approaches for variation-aware digital testing either restrict themselves to special classes of defects or assume given probability distributions to model variabilities, the proposed approach combines defectoriented testing with statistical library characterization. It uses Monte Carlo simulations at electrical level to extract delay distributions of cells in the presence of defects and for the defectfree case. This allows distinguishing the effects of process variations on the cell delay from defectinduced cell delays under process variations. To provide a suitable interface for test algorithms at higher levels of abstraction the distributions are represented as histograms and stored in a histogram data base (HDB). Thus, the computationally expensive defect analysis needs to be performed only once as a preprocessing step for library characterization, and statistical test algorithms do not require any low level information beyond the HDB. The generation of the HDB is demonstrated for primitive cells in 45nm technology.

关键词： Defect-oriented testing parameter variations delay analogue fault simulation histograms

作者: Fabian Hopsch Bernd Becker Sybille Hellebrand Ilia Polian Bernd Straube Hans-Joachim

作者单位: Fraunhofer IIS/EAS Dresden, Germany University of Freiburg Germany University of Paderborn Germany University of Passau Germany Wolfgang Vermeiren Fraunhofer IIS/EAS Dresden, Germany Wunderlich University of Stuttgart Germany

会议类型: 国际会议

会议名称: 2010 19th IEEE Asian Test Symposium(第19届IEEE亚洲测试技术学术会议 ATS 2010)

会议地点: 上海

会议语种:英文

页码: 87-93

在线出版日期: 2010-12-01（万方平台首次上网日期，不代表论文的发表时间）