Diagnosis of Multiple Physical Defects Using Logic Fault Models

摘要：

In this work, we propose a method to improve diagnosis results when multiple physical defects are present in circuits under diagnosis. To improve diagnosis results when multiple defects are present in a circuit under diagnosis, the proposed method includes (i) analyzing relations among locations of logic faults and their diagnostic metrics to carefully derive physical faults, (ii) a new set covering procedure and (iii) a method to assign scores to faults to derive candidate sets of faults. Experimental results on several industrial designs and several cases of silicon defects show the effectiveness of the proposed diagnosis method.

作者: Xun Tang Wu-Tung Cheng Ruifeng Guo Sudhakar M. Reddy

作者单位: The University of Iowa Mentor Graphics Corp

会议类型: 国际会议

会议名称: 2010 19th IEEE Asian Test Symposium(第19届IEEE亚洲测试技术学术会议 ATS 2010)

会议地点: 上海

会议语种:英文

页码: 94-99

在线出版日期: 2010-12-01（万方平台首次上网日期，不代表论文的发表时间）