On Soft Error Immunity of Sequential Circuits
With technology scaling, radiation-induced soft error has been a major concern even for mainstream enterprise applications. Since various hardening solutions impose significant costs in performance, area and power consumption, full soft error protection can hardly satisfy the multiple design goals simultaneously. Recent studies have noted that the circuits have partial intrinsic immunity to soft errors. And the interest in using the circuits intrinsic immunity to improve the tradeoffs between reliability and various overhead from hardening is growing. However, most existing approaches cannot use it well. In this paper, the aim is to explore the principal source of the circuits immunity to guide fault tolerance to make better use of it We categorized the components in a circuit into three classes: components with full immunity, with partial immunity and without immunity. By experimental and theoretical analysis, it is proved that the circuits intrinsic immunity mainly stems from the components with partial immunity1.
Soft error reliability evaluation
Dan Zhu Tun Li Si-kun Li
School of Computer Science, National University of Defense Technology, Changsha, China 410073
国际会议
2010 19th IEEE Asian Test Symposium(第19届IEEE亚洲测试技术学术会议 ATS 2010)
上海
英文
106-110
2010-12-01（万方平台首次上网日期，不代表论文的发表时间）