P2CLRAF: An Pre-and Post-silicon Cooperated Circuit Lifetime Reliability Analysis Framework

摘要：

Statistical static timing analysis (SSTA) considering process variation and aging effects is usually used to analyze circuit lifetime reliability at design phase. A key challenge for statistical lifetime reliability analysis is that an accurate statistical timing model is needed to carefully model practical variation distribution as well as delay correlation. In this work, P2CLRAF, a circuit lifetime reliability analysis framework is proposed. It calibrates presilicon SSTA result by learning the collected data from path delay testing at post-silicon timing validation phase. A neural network inside P2CLRAF is trained to learn variation distribution and delay correlation based on the statistic of path delay testing. The learned information is then fed back to SSTA to further improve the accuracy of circuit lifetime reliability analysis. Experimental results demonstrate the effectiveness of the proposed analysis framework.

关键词： Lifetime Reliability Process Variation NBTI

作者: Song Jin Yinhe Han Huawei Li Xiaowei Li

作者单位: Key Laboratory of Computer System and Architecture, Institute of Computing Technology, Chinese Academy of Sciences, Beijing, P.R. China Graduate University of Chinese Academy of Sciences, Beijing, P.R. China

会议类型: 国际会议

会议名称: 2010 19th IEEE Asian Test Symposium(第19届IEEE亚洲测试技术学术会议 ATS 2010)

会议地点: 上海

会议语种:英文

页码: 117-120

在线出版日期: 2010-12-01（万方平台首次上网日期，不代表论文的发表时间）