Efficient Embedding of Deterministic Test Data

摘要：

Systems with many integrated circuits (ICs), often of the same type, are increasingly common to meet the constant performance demand. However, systems in recent semiconductor technologies require not only manufacturing test, but also in-field test Preferably, the same test set is utilized both at manufacturing test and in-field test While deterministic test patterns provide high fault coverage, storing complete test vectors leads to huge memory requirements and inflexibility in applying tests. In an IEEE 1149.1 (Boundary scan) environment this paper presents an approach to efficiently embed deterministic test patterns in the system by taking structural information of the system into account Instead of storing complete test vectors, the approach stores only commands and component-specific test sets per each unique component Given a command, test vectors are created by a test controller during test application. The approach is validated on hardware and experiments on ITC02 benchmarks and industrial circuits show that the memory requirement for storing the test data for a system is highly related to the number of unique components.

关键词： In-field test Embedded boundary scan test System test Multiple identical cores Test controller

作者: Mudassar Majeed Daniel Ahlstrom Urban Ingelsson Gunnar Carlsson Erik Larsson

作者单位: Department of Computer and Information Science, Linkoping University, Sweden Ericsson AB BU Networks SE-164 80 Stockholm, Sweden

会议类型: 国际会议

会议名称: 2010 19th IEEE Asian Test Symposium(第19届IEEE亚洲测试技术学术会议 ATS 2010)

会议地点: 上海

会议语种:英文

页码: 159-162

在线出版日期: 2010-12-01（万方平台首次上网日期，不代表论文的发表时间）