High Performance Compaction for Test Responses with many Unknowns

摘要：

We present a new compactor architecture for extreme compaction of test responses with a high percentage of x-values. The test response data is compacted into a single, 1-bit wide bit stream. A major contribution of this work is a new technique to efficiently load x-masking data into a masking logic. A method eliminating the need for explicit mask control signals using ATE timing flexibility is also introduced. The proposed compactor can efficiently be employed in multi-chip testing. Experiments with industrial designs show that the proposed compactor enables compaction ratios exceeding 200x.

关键词： x-values x-masking response compaction

作者: Thomas Rabenalt Michael Richter Michael Goessel

作者单位: University of Potsdam Department of Computer Science Potsdam, Germany

会议类型: 国际会议

会议名称: 2010 19th IEEE Asian Test Symposium(第19届IEEE亚洲测试技术学术会议 ATS 2010)

会议地点: 上海

会议语种:英文

页码: 179-184

在线出版日期: 2010-12-01（万方平台首次上网日期，不代表论文的发表时间）