XOR-Based Response Compactor Adaptive to X-Density Variation
Scan architectures with compression support have remedied the test time and data volume problems of todays sizable designs. On-chip compression of responses enables the transmission of a reduced volume signature information to the ATE, delivering test data volume savings, while it engenders the challenge of retaining test quality. In particular, unknown bits (xs) in responses corrupt other response bits upon being compacted altogether, masking their observation, and hence preventing the manifestation of the fault effects they possess. In this work, we propose the design and utilization of a response compactor that can adapt to the varying density of xs in responses. In the proposed design, fan-out of scan chains to XOR trees within the compactor can be adjusted per pattern/slice so as to minimize the corruption impact of xs. Adaptiveness of the proposed response compactor enhances the observability of scan cells cost-effectively.
VLSI test Scan-based test Test response compaction Response xs Adaptive compaction
Samah Mohamed Saeed Ozgur Sinanoglu
Computer Science Department Polytechnic Institute of New York University Computer Engineering Department New York University Abu Dhabi
国际会议
2010 19th IEEE Asian Test Symposium(第19届IEEE亚洲测试技术学术会议 ATS 2010)
上海
英文
212-217
2010-12-01（万方平台首次上网日期，不代表论文的发表时间）