DFT+DFD: An Integrated Method for Design for Testability and Diagnosability
While conventional test point insertions commonly used in design for testability can improve fault coverage, the test points selected may not necessarily be the best candidates to aid silicon diagnosis. In this paper, test point insertions are conducted with the aim to detect more faults and also synergistically distinguish currently indistinguishable fault-pairs. We achieve this by identifying those points in the circuit, which are not only hard-to-test but also lie on distinguishable frontiers, as Testability-Diagnosability (TD) points. To this end, we propose a novel low-cost metric to identify such TD points. Further, we propose a new DFT + DFD architecture, which adds just one pin (to identify test/functional mode) and small additional combinational logic to the circuit under test. Our experiments indicate that the proposed architecture can distinguish 4x more previously indistinguishable fault-pairs than existing DFT architectures while maintaining similar fault coverages. Further, experiments illustrate that quality results can be achieved with an area overhead of around 5％.
Test Points Diagnostic Resolution Weighted Average
Nikhil Rahagude Maheshwar Chandrasekar Michael S. Hsiao
Department of Electrical and Computer Engineering, Virginia Tech, Blacksburg, Virginia - 24061
国际会议
2010 19th IEEE Asian Test Symposium(第19届IEEE亚洲测试技术学术会议 ATS 2010)
上海
英文
218-223
2010-12-01（万方平台首次上网日期，不代表论文的发表时间）