Digitally Assisted Concurrent Built-in Tuning of RF Systems Using Hamming Distance Proportional Signatures
In this paper, a novel built-in tuning technique to compensate for variability induced imperfections in RF subsystems is proposed. The test stimulus is obtained from a filtered digital pattern and the RF response is down-converted using an envelope detector. The resulting signal is mapped to a digital signature, such that the Hamming Distance between the observed and the golden signature represents the degree by which the circuit specifications (Gain, IIP3, EVM, etc) differ from the ideal. A hardware driven algorithm is used to minimize this Hamming Distance to concurrently optimize (tune) multiple RF specifications. As opposed to prior research, the method does not require the use of an on-chip digital signal processor and uses minimal on-chip hardware. Results obtained on a 2.4 GHz transmitter subsystem show significant impact of tuning on device specifications.
S.Devarakond S.Sen,V.Natarajan A.Banerjee H.Choi G.Srinivasan A.Chatterjee
School of Electrical and Computer Engineering, GA,*Texas Instruments, TX
国际会议
2010 19th IEEE Asian Test Symposium(第19届IEEE亚洲测试技术学术会议 ATS 2010)
上海
英文
283-288
2010-12-01（万方平台首次上网日期，不代表论文的发表时间）