The Test Ability of an Adaptive Pulse Wave for ADC Testing
In the conventional ADC production test method, a high-quality analogue sine wave is applied to the Analogue-to-Digital Converter (ADC), which is expensive to generate. Nowadays, an increasing number of ADCs are integrated into a system-on-chip (SoC) platform design, which usually contains a digital embedded processor. In such a platform, a digital pulse wave is obviously less expensive to generate than an accurate analogue sine wave. As a result, the usage of a digital pulse wave has been investigated to test ADCs as the test stimulus. In this paper, the ability of a digital adaptive pulse wave for ADC testing is presented via the measurement results. Instead of the conventional FFT analysis, a timedomain analysis is exploited for post-processing, from which a signature result can be obtained. This signature can distinguish between faulty devices and the fault-free devices. It is also used in the machine-learning-based test method to predict the dynamic specifications of the ADC. The experimental results of a 12-bit 80 M/s pipelined ADC are shown to evaluate the sensitivity and accuracy of using a pulse wave to test an ADC.
ADC test pulse wave machine-learning-based signature measurement
Xiaoqin Sheng Hans G. Kerkhoff
CTIT-TDT Group University of Twente Enschede, the Netherlands
国际会议
2010 19th IEEE Asian Test Symposium(第19届IEEE亚洲测试技术学术会议 ATS 2010)
上海
英文
289-294
2010-12-01（万方平台首次上网日期，不代表论文的发表时间）