An Efficient Algorithm for Finding a Universal Set of Testable Long Paths

摘要：

In this paper, we focus on generation of a universal path candidate set V that contains testable long paths for delay testing. Some strategies are presented to speed up the depth first search procedure of U generation, targeting the reduction of sensitization criteria checking times. Experimental results illustrate that our approach achieves an 8X speedup on average in comparison with the traditional depth first search approach.

关键词： delay testing testable long paths

作者: Zijian He Tao Lv Huawei Li Xiaowei Li

作者单位: Key Laboratory of Computer System and Architecture, Institute of Computing Technology Chinese Academ Key Laboratory of Computer System and Architecture, Institute of Computing Technology Chinese Academ

会议类型: 国际会议

会议名称: 2010 19th IEEE Asian Test Symposium(第19届IEEE亚洲测试技术学术会议 ATS 2010)

会议地点: 上海

会议语种:英文

页码: 319-324

在线出版日期: 2010-12-01（万方平台首次上网日期，不代表论文的发表时间）