On Bias in Transition Coverage of Test Sets for Path Delay Faults

摘要：

A test for a delay fault can be considered as covering a transition on one or more lines. A bias in the transition coverage of a delay test set implies that more rising or more falling transitions are covered by the test set. Such a bias is not captured by fault coverage metrics that consider both types of transitions together. We study the bias in the transition coverage of test sets for path delay faults. The results demonstrate that the bias is circuit-dependent. It also depends on the type of two-pattern tests used. In general, broadside tests show more bias than skewed-load tests, while enhanced-scan tests show little bias. We also consider the use of partial-enhanced-scan for reducing the bias exhibited by broadside tests.

关键词： broadside tests path delay faults scan circuits skewed-load tests transition coverage

作者: Irith Pomeranz Sudhakar M. Reddy

作者单位: School of Electrical & Computer Eng. Purdue University W. Lafayette, IN 47907, U.S.A. Electrical & Computer Eng. Dept. University of Iowa Iowa City, IA 52242, U.S.A.

会议类型: 国际会议

会议名称: 2010 19th IEEE Asian Test Symposium(第19届IEEE亚洲测试技术学术会议 ATS 2010)

会议地点: 上海

会议语种:英文

页码: 349-352

在线出版日期: 2010-12-01（万方平台首次上网日期，不代表论文的发表时间）