ESD Design for Power Analog Circuit

摘要：

A non-trivial nature of the power management circuit design is emphasized based on three case studies. The events of transient latchup and device failure under Charged Device Model (CDM) pulse due to an unexpected current path in power analog circuits are analyzed demonstrating the value of mixed-mode simulation approach.

作者: V.A. Vashchenko A.A. Shibkov

作者单位: National Semiconductor Corp., 2900 Semiconductor Drive, Santa Clara, CA, 95052, USA Angstrom Design Automation, San Jose, CA, USA

会议类型: 国际会议

会议名称: 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology(第十届固态和集成电路技术国际会议 ICSICT-2010)

会议地点: 上海

会议语种:英文

页码: 172-175

在线出版日期: 2010-11-01（万方平台首次上网日期，不代表论文的发表时间）