Digitally-Assisted Sample-to-Sample Jitter Correction in ADC Systems

摘要：

In this paper we present a technique that permits the correction of errors caused by the timing jitter associated with sampling clocks cadencing analog-todigital converters (ADCs). The correction system is digital, completely independent of the front-end ADC and corrects the data out of the converter on a sample-to-sample basis. Relative to the ADC under consideration, the proposed technique enables quasizero jitter sampling characteristics which is demonstrated experimentally in this paper.

作者: Mourad Oulmane Gordon W. Roberts

作者单位: Integrated Microsystems Laboratory, McGill University 3480 University Street, Montreal, Quebec, CANADA H3A 2A7

会议类型: 国际会议

会议名称: 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology(第十届固态和集成电路技术国际会议 ICSICT-2010)

会议地点: 上海

会议语种:英文

页码: 302-305

在线出版日期: 2010-11-01（万方平台首次上网日期，不代表论文的发表时间）