Worst Case Analysis of Linear Analog Circuit Performance Based on Kharitonovs Rectangle

摘要：

In the spirit of Kharitonovs rectangle, an efficient worst case analysis approach for linear analog circuit performance under process variations is proposed in this paper. By contrast with the Monte Carlo method, the proposed approach strongly reduces the computation to only evaluate a few of Kharitonovtype critical transfer functions, whose envelop will give the worst case variation range of performance metrics. The computational efficiency of the method suggested is demonstrated by a real analog circuit example.

作者: Liuxi Qian Dian Zhou Sheng-Guo Wang Xuan. Zeng

作者单位: Erik Jonsson School of Engineering and Computer Science, University of Texas at Dallas, Dallas, TX 7 College of Engineering, University of North Carolina at Charlotte, Charlotte, NC 28223-0001, USA Department of Microelectronics, Fudan University, Shanghai 201203, China

会议类型: 国际会议

会议名称: 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology(第十届固态和集成电路技术国际会议 ICSICT-2010)

会议地点: 上海

会议语种:英文

页码: 800-802

在线出版日期: 2010-11-01（万方平台首次上网日期，不代表论文的发表时间）